Requirements for X-ray fluorescence spectrometers
The document provides the physical principles and specifies instrumental requirements for total reflection X‑ray fluorescence analysis (TXRF) spectrometers. This document specifies general procedures for calibration, method development and verification of TXRF measurements. The company offers a complete range of X-ray fluorescence portable spectrometers, as well as a broad range of bench-top ED-XRF spectrometers for special elemental analysis tasks to multi-purpose laboratory spectrometers for trace element analysis.
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